Low voltage sense amplifier and sensing method

ABSTRACT

Systems and methods of sensing a data state coupled to a digit line and for coupling a digit line to a sense amplifier. In sensing the data state coupled to the digit line, the digit line is coupled to a sense node and driving voltages provided to the sense amplifier. The data state is latched in response to the driving voltages. In coupling the digit line to a sense amplifier, the digit line is coupled to the sense amplifier for a first time period and decoupled from the sense amplifier for a second time period. The digit line is coupled to the sense amplifier at a controlled rate following the second time period.

TECHNICAL FIELD

The invention relates to memory devices, and more particularly, to senseamplifiers used to sense differential voltages produced by memory cellsin memory devices, such as dynamic random access memory (“DRAM”)devices.

BACKGROUND OF THE INVENTION

In modern semiconductor memories, the desire to lower power consumptionhas resulted in a decrease in the magnitude of a supply voltage VCCwhich provides power to the memories. Electronic systems typicallybenefit from lower power consumption, particularly portable systemswhich are battery powered. When the supply voltage VCC decreases,reference voltage circuitry in the memory that develops referencevoltages which are a function of the supply voltage accordingly developreference voltages having different values. For example, in manysemiconductor memories digit lines are biased and equilibrated to avoltage equal to the supply voltage VCC divided by two. In thissituation, a change in the supply voltage from 5 volts to 3.3 voltsresults in the reference voltage changing from 2.5 volts to 1.65 volts.Such a decrease in the reference voltage may affect the circuitry in thememory during operation.

One type of circuit that may be affected by a decrease in the biasvoltage is a sense amplifier circuit. In a typical dynamic random accessmemory (“DRAM”), a sense amplifier circuit senses data stored in amemory cell by sensing a voltage differential between a pair ofcomplementary digit lines associated with the memory cell, as known inthe art. The sense amplifier circuit senses the voltage differential anddrives the digit line at the higher voltage to approximately the supplyvoltage VCC,and the digit line at the lower voltage to approximatelyzero volts. Typically, the sense amplifier circuit includes NMOS andPMOS transistors coupled between the digit lines. When the supplyvoltage VCC decreases, the threshold voltages VT of these transistorsmay prevent the sense amplifier circuit from driving the digit lines tothe desired voltages as will be explained in more detail below.

FIG. 1 is a block diagram and simplified schematic of a conventionalsense amplifier 12 having an open digit line configuration. The senseamplifier 12 senses data stored in memory cells (not shown) of cellarrays 2A, 2B that are coupled to complementary digit lines D, D_,respectively. As known, the cell arrays 2A, 2B typically include severaldigit lines D, D_ with each pair of digit line coupled to a respectivesense amplifier. FIG. 1 illustrates only one of the sense amplifiers inorder to simplify the following description. Binary data are stored inthe memory cells utilizing a respective storage capacitor. The capacitorcan be charged or can be left uncharged to store two types of data. Whenaccessing a particular memory cell, the respective storage capacitor iscoupled to a corresponding digit line. Prior to coupling the memory cellto the digit line, the digit line and a complementary digit line, bothof which are coupled to a corresponding sense amplifier, are prechargedto a voltage, typically VCC/2. In response to coupling the memory cellto the digit line, the stored charge or lack of charge causes a changein the voltage of digit line, which is detected by the sense amplifiercoupled to the digit line. Based on the differential voltage between thedigit line to which the memory cell is coupled and the complementarydigit line, the sense amplifier amplifies and latches the data. Thesense amplifier 12 includes PMOS transistors 20, 22 and NMOS transistors24, 26 which are cross coupled to form PMOS and NMOS latches. The digitline D is coupled to a sense node 28 through an isolation transistor 6Aand the digit line D_ is coupled to a sense node 30 through an isolationtransistor 6B. An isolation switch driver circuit 10 provides ISOA, ISOBsignals that control the isolation transistors 6A, 6B, respectively.

Operation of the sense amplifier will be described with reference to thetiming diagram of FIG. 2. In the following example, it is assumed thatthe memory cell to be accessed is storing charge and is located in cellarray 2A. Prior to time TO, a precharge circuit (not shown) sets thevoltage of the digit lines D, D_ to VCC/2. At time T0, the ISOA, ISOBsignals are driven to a pumped supply voltage VCCP that is greater thanthe VCC voltage. The ISOA, ISOB signals switch ON isolation transistors6A, 6B to couple the digit lines D, D_ to the respective sense nodes 28,30. At time T1, a word line (not shown) becomes active to couple thememory cell to the corresponding digit line D. As a result, the voltageof the digit line D is slightly increased. At a time T2, ACT and RNL_signals become active, providing VCC to the sources of the PMOStransistors 20, 22 and ground to the sources of the NMOS transistors 24,26. In response to the ACT and RNL_ signals, the sense amplifier 12 isactivated and drives the digit line D to VCC and drives the digit lineD_ to ground. In this state, the sense amplifier 12 has sensed andlatched data.

As previously discussed, operation of conventional sense amplifiers canbe affected by decreased VCC voltage. One effect is that the lower VCC/2voltage to which the digit lines D, D_ are precharged approaches the VTof the NMOS transistors 24, 26. Consequently, when the ACT and RNL_signals become active, the sensing operation can take longer because theNMOS transistors 24, 26 do not switch ON as quickly, waiting for thepositive feedback of the PMOS latch to provide sufficient voltage tofully switch ON the NMOS transistors 24, 26. The NMOS transistors 24, 26can be designed to have lower VTs to accommodate a lower VCC voltage.However, lowering the VT also reduces the resistance of the senseamplifier 12 to erroneous latching due to electrical noise which may becoupled through the digit lines D, D_ to the sense amplifier 12.

Therefore, there is a need for a sense amplifier and/or sensing schemethat can be used to quickly and reliably sense data stored in memorycells in a semiconductor memory having reduced supply voltage.

SUMMARY OF THE INVENTION

In one aspect of the invention, a sense amplifier circuit includes alatch circuit, and first and second voltage supply circuits. The latchcircuit is coupled to a digit line and is configured to latch a datastate coupled to the digit line and further configured to generatedifferential data signals in response to the data state. Thedifferential data signals have first and second voltages. The firstvoltage supply circuit is coupled to the latch circuit and is configuredto provide a positive voltage as the first voltage. The second voltagesupply circuit is coupled to the latch circuit and is configured toprovide a negative voltage as the second voltage. In another aspect ofthe invention, the first voltage supply is coupled to the latch circuitand is configured to provide a voltage greater than a device supplyvoltage as the first voltage and the second voltage supply is configuredto provide the second voltage.

In another aspect of the invention, a sense amplifier circuit includes alatch circuit, a coupling circuit, and a control circuit. The latchcircuit has a node and is configured to latch a data state coupled tothe node and is further configured to generate differential data signalsin response to the data state. The coupling circuit is coupled to thenode of the latch and to a digit line to which data states are coupled.The coupling circuit is configured to couple the digit line to the nodeof the latch responsive a control signal. The control circuit is coupledto the coupling circuit and is configured to control the couplingcircuit to couple the digit line to the node and decouple the digit lineand the node during a first phase. The control circuit is furtherconfigured to control the coupling circuit to couple the digit line tothe node during a second phase subsequent to the first phase. The digitline and the node are coupled at a controlled rate during the secondphase.

In another aspect of the invention a method of sensing a data statecoupled to a digit line is provided. The method includes coupling thedigit line to a sense node and providing a negative voltage. The datastate is latched in response to the negative voltage. In another aspectof the invention a method of coupling a digit line to a sense amplifieris provided. The method includes coupling the digit line to the senseamplifier for a first time period and decoupling the digit line from thesense amplifier for a second time period. The digit line is coupled tothe sense amplifier at a controlled rate following the second timeperiod.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram and simplified schematic diagram of aconventional open digit line sense amplifier configuration.

FIG. 2 is a timing diagram of various signals during operation of thesense amplifier of FIG. 1.

FIG. 3 is a block diagram and simplified schematic diagram of a opendigit line sense amplifier configuration including an N-latch drivercircuit according to an embodiment of the present invention.

FIGS. 4A and 4B are schematic diagrams of N-latch driver circuitsaccording to various embodiments of the present invention.

FIG. 5 is a timing diagram of various signals during operation of theN-latch driver according to an embodiment of the present invention.

FIG. 6 is a schematic diagram of an isolation switch driver circuitaccording to an embodiment of the present invention that can be used inthe sense amplifier configuration shown in FIG. 3.

FIG. 7 is a timing diagram of various signals during operation of theisolation switch driver circuit of FIG. 6.

FIG. 8 is a block diagram of a memory device having an N-latch drivercircuit and/or an isolation switch driver circuit according toembodiments of the present invention.

FIG. 9 is a block diagram of a processor-based system having the memorydevice of FIG. 8.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

Certain details are set forth below to provide a sufficientunderstanding of the invention. However, it will be clear to one skilledin the art that the invention may be practiced without these particulardetails. Moreover, the particular embodiments of the present inventiondescribed herein are provided by way of example and should not be usedto limit the scope of the invention to these particular embodiments. Inother instances, well-known circuits, control signals, and timingprotocols.

FIG. 3 illustrates the sense amplifier 12 having an N-latch drivercircuit 60 according to an embodiment of the present invention. Aspreviously described with reference to FIG. 2, the sense amplifier 12senses and amplifies the voltages of the digit lines D, D_ in responseto the ACT and RNL_ signals becoming active. The ACT and RNL_ signalsare typically half of the VCC voltage until becoming active, at whichtime the active ACT signal switches to the VCC voltage and the activeRNL_ signal switches to a negative voltage or initially ground and thento a negative voltage, as will be described in more detail below. Asalso previously discussed, as using lower VCC voltages becomes moredesirable, this presents the challenge of having a precharge voltage forthe digit lines D, D_ that is sufficient to quickly switch ON the NMOStransistors 24, 26 during a sense operation.

The N-latch driver circuit 60 is coupled to the sources of the NMOStransistors 24, 26 to provide an NMOS sense signal RNL_ having a voltagethat is less than ground (i.e., 0 volts). Providing a RNL_ signal havinga negative voltage increases the gate-source voltage across the NMOStransistors 24, 26 during a sense operation, relative to theconventional NLAT_ signal that is at ground. As a result, the NMOStransistors 24, 26 can be switched ON more quickly. A P-latch drivercircuit 62 is also illustrated in FIG. 3. The P-latch driver circuit 62can be optionally included in addition or alternatively to the N-latchdriver circuit 60. The P-latch driver circuit 62 is coupled to thesources of the PMOS transistors 20, 22 to provide an active PMOS sensesignal ACT in response to a PLAT signal. The ACT signal provided by theP-latch driver 62 is greater than the VCC voltage for at least some timeperiod following the beginning of the sense operation to increase thegate-source voltage across the PMOS transistors 20, 22 compared toapplying VCC. As a result, the PMOS transistors 20, 22 can be switchedON more quickly when using lower operating voltages. Embodiments of theN-latch driver circuit 60 will be described in greater detail below. Itwill be appreciated that those ordinarily skilled in the art will obtainsufficient understanding from the description provided herein to applysome or all of the principles to embodiments of the P-latch drivercircuit 62. Consequently, in the interest of brevity, a more detaileddescription of the P-latch driver circuit 62 is not provided.

FIG. 4A illustrates an N-latch driver circuit 60A according to anembodiment of the present invention. The N-latch driver circuit 60Aincludes an inverter 70 and an NMOS transistor 72 having a sourcecoupled to a negative voltage supply 71, shown in FIG. 4A as a −0.3Vvoltage supply. The RNL_ signal is provided at the drain of the NMOStransistor 72. Operation of the N-latch driver circuit 60A and the senseamplifier 12 is similar to that previously described with respect to thetiming diagram of FIG. 2. In response to the NLAT_ signal becoming LOWat time T2 (FIG. 2), the output of the inverter 70 switches to a HIGHlevel to switch ON the NMOS transistor 72, thereby coupling the negativevoltage supply 71 to the output of the N-latch driver circuit 60A. Thenegative voltage is applied to the sources of the NMOS transistors 24,26 of the sense amplifier 12. As previously discussed, the negativevoltage of the RNL_ signal enhances the gate-source voltage across theNMOS transistors 24, 26 to assist in switching ON the appropriate NMOStransistor 24, 26 during the sensing operation.

FIG. 4B illustrates an N-latch driver circuit 60B according to anotherembodiment of the present invention. The output of the N-latch drivercircuit 60B is coupled to a negative voltage supply 71 through an NMOStransistor 72, and further coupled to ground through an NMOS transistor84. The gate of the NMOS transistor 72 is coupled to an output of aone-shot circuit 80 that generates a NLATP signal that has positivepulse in response to the NLAT_ signal becoming LOW. The NLATP signal isalso provided to a NOR gate 82 which has another input coupled toreceive the NLAT_ signal. The output of the NOR gate 82 is coupled tothe gate of the NMOS transistor 84.

Operation of the N-latch driver circuit 60B will be described withreference to the timing diagram of FIG. 5. At time T0, a word line (notshown) is activated to couple a memory cell to the respective digitline. The word line corresponds to the row of memory in which the memorycell to be accessed is located. When the word line is activated, thememory cell to be accessed is coupled to a corresponding digit line D.In the present example it will be assumed that a memory cell in the cellarray 2A that is storing charge has been coupled to the digit line D inresponse to the activated word line. As shown in FIG. 5, the coupling ofthe memory cell causes the voltage of the digit line D to increase. TheNLATP and NLATG signals remain LOW because the RNL_ signal is at VCC/2.

At time T1, the ACT and RNL_ signals become HIGH and LOW, respectively.

In response to the RNL_ signal becoming LOW, the one shot circuit 80generates a positive pulse in the NLATP signal. The NMOS transistor 72is switched ON in response to the pulse of the NLATP signal and couplesthe output of the N-latch driver circuit 60B to the negative voltagesupply 71. The NMOS transistor 84 remains OFF because the NLAT_ signalis LOW and the NLATP signal is HIGH causing the NOR gate 82 to continueto output a LOW NLATG signal. With the sources of the NMOS transistors24, 26 of the sense amplifier 12 coupled to the negative voltage supply71, there is sufficient gate-source voltage to quickly sense thevoltages of the digit lines D, D_ and latch data. In the presentexample, the digit line D driven to the voltage of the ACT signal andthe digit line D_ driven to the negative voltage of the negative voltagesupply 71.

At time T2, the duration of the positive pulse ends and the NLATP signalbecomes LOW, switching OFF the NMOS transistor 72 and decoupling theoutput of the N-latch driver circuit 60B from the negative voltagesupply 71. With both the NLATP and NLAT_ signals LOW, however, the NLATGsignal output by the NOR gate 82 becomes HIGH to switch ON the NMOStransistor 84 and couple the output of the N-latch driver circuit 60B toground. The result is the voltage of the RNL_ signal changes from thenegative supply voltage to ground, and consequently, the voltage of thedigit line coupled to the output of the N-latch increases to ground aswell.

FIG. 6 illustrates an isolation switch driver circuit 100 according toan embodiment of the present invention. The isolation switch drivercircuit 100 can be substituted for the conventional isolation switchdriver circuit 10 shown in FIGS. 1 and 3. The isolation switch drivercircuit 100 includes first and second NMOS transistors 110 and 114coupled in series between a power supply VCC and ground. The ISOA andISOB signals are provided at a node 113. The isolation switch drivercircuit 100 further includes a PMOS transistor 112 coupled to a boostedpower supply VCCP and the node 113. The voltage of the VCCP supply isgreater than the voltage of the VCC supply. The gate of each transistor110, 112, 114 is coupled to receive a respective control signal A, B, C.As will be described in more detail below, the A, B, C signals aregenerated by a control circuit 115 further included in the isolationswitch driver circuit 100. In response to an active word line signal WL,the control circuit 115 generates A, B, C signals as illustrated in FIG.7. Those ordinarily skilled in the art will obtain sufficientunderstanding of the control circuit 115 from the description providedherein to practice the invention.

FIG. 7 is a timing diagram of various signals during operation of theisolation switch driver circuit 100. At time T0, the B, C signals areLOW so that the PMOS transistor 112 is ON and the NMOS transistor 114 isOFF. As a result, the node 113 is coupled to the VCCP supply at time T0to provide ISOA, ISOB signals that switch ON the isolation transistors6A, 6B (FIG. 1). For the present example, it will be assumed that amemory cell storing charge and located in cell array 2A is to beaccessed. At time T1, a word line (not shown) of cell array 2A isactivated. As a result, the digit line D and the corresponding node 28exhibit an increase in potential. The complementary digit line D_ andthe corresponding node 30 remains at the digit line precharge level ofVCC/2.

At time T2, the B and C signals are switched to HIGH levels to decouplethe node 113 from the VCCP supply and couple the node 113 to ground. Inresponse, the ISOA, ISOB signals switch LOW to switch OFF the isolationtransistors 6A, 6B to isolate the digit lines D, D_ from the respectivesense nodes 28, 30. The increase in potential due to the digit line Dbeing coupled to the memory cell remains present at the correspondingsense node 28. At time T3, the ACT and RNL_ signals become active andthe change in potential at the sense node 28 is amplified by the senseamplifier 12, as previously described. Consequently, during the timefollowing T3, the nodes 28, 30 are driven to the respective voltages ACTand RNL_. Decoupling the nodes 28, 30 from the digit lines D, D_ priorto the ACT and RNL_ signals becoming active reduces the initial sensingcurrent and also isolates the sense amplifier 12 from the digit linecapacitance of digit lines D, D_. Additionally, decoupling the nodes 28,30 from the digit lines D, D_ during the sensing operation also isolatesthe sense amplifier 12 from any noise or disturbance in the respectivecell arrays 2A, 2B that may interfere with the sensing operation.

At time T4, the C signal is brought LOW to decouple the node 113 fromground and the A signal is brought HIGH to activate the transistor 110and couple the node 113 to the VCC supply. In response, the ISOA, ISOBsignals are driven to the VCC voltage. At time T5, both the A and Bsignals are brought LOW causing the node 113 to be coupled to the VCCPsupply. The node 113 is pulled to the VCCP voltage between time T5 andT6 in an increasing manner to control the rate at which the isolationtransistors 6A, 6B are switched ON in response to the ISOA, ISOBsignals. As a result, electrical disturbance to the nodes 28 and 30(FIG. 3) can result from recoupling the digit lines D, D_ to the nodes28, 30 is reduced. The changes in the voltages of nodes 28, 30 shown inFIG. 7 between times T5 and T6 illustrate the reduced electricaldisturbance that results from controlling the rate at which the ISOA,ISOB signals increase and the manner in which the isolation transistors106A, 106B are switched ON. The rate at which the ISOA, ISOB signalsincrease can be controlled by tailoring parameters of the PMOStransistor 112. For example, adjusting the channel width and the VT ofthe PMOS transistor 112 can be used for this purpose.

In an alternative embodiment, an N-latch driver circuit according to anembodiment of the present invention can be combined with an isolationswitch driver circuit according to an embodiment of the presentinvention. For example, the N-latch driver circuit 60B of FIG. 4B can becombined with the isolation switch driver circuit 100 of FIG. 6. Withreference to the timing diagram of FIG. 5, times T0, T1 and T2 cancorrespond to times T1, T3, and T4, respectively, of the timing diagramof FIG. 7. In such an embodiment, the voltage of the RNL_ signal isswitched from a negative voltage to ground prior to the time theisolation transistors 6A, 6B are switched ON. As a result, currentconsumption in response to recoupling the digit lines D, D_ to the nodes28, 30 is relative to ground instead of a negative voltage, therebyreducing the current consumption.

FIG. 8 is a block diagram of a conventional synchronous dynamic randomaccess memory (“SDRAM”) 200 that utilizes an N-latch driver circuitaccording to an embodiment of the present invention and/or an isolationswitch driver circuit according to an embodiment of the presentinvention. Of course, the embodiments of the N-latch driver circuit andisolation switch driver circuit can also be used in other DRAM devicesand other memory devices, such as SRAM devices, FLASH memory devices,etc.

The operation of the SDRAM 200 is controlled by a command decoder 204responsive to high-level command signals received on a control bus 206.These high level command signals, which are typically generated by amemory controller (not shown in FIG. 8), are a clock enable signal CKE*,a clock signal CLK, a chip select signal CS*, a write enable signal WE*,a row address strobe signal RAS*, a column address strobe signal CAS*,and a data mask signal DQM, in which the “*” designates the signal asactive low. The command decoder 204 generates a sequence of commandsignals responsive to the high level command signals to carry out thefunction (e.g., a read or a write) designated by each of the high levelcommand signals. These command signals, and the manner in which theyaccomplish their respective functions, are conventional. Therefore, inthe interest of brevity, a further explanation of these command signalswill be omitted.

The SDRAM 200 includes an address register 212 that receives rowaddresses and column addresses through an address bus 214. The addressbus 214 is generally coupled to a memory controller (not shown in FIG.8). A row address is generally first received by the address register212 and applied to a row address multiplexer 218. The row addressmultiplexer 218 couples the row address to a number of componentsassociated with either of two memory banks 220, 222 depending upon thestate of a bank address bit forming part of the row address. Associatedwith each of the memory banks 220, 222 is a respective row address latch226, which stores the row address, and a row decoder 228, which decodesthe row address and applies corresponding signals to one of the arrays220 or 222. The row address multiplexer 218 also couples row addressesto the row address latches 226 for the purpose of refreshing the memorycells in the arrays 220, 222. The row addresses are generated forrefresh purposes by a refresh counter 230, which is controlled by arefresh controller 232. The refresh controller 232 is, in turn,controlled by the command decoder 204.

After the row address has been applied to the address register 212 andstored in one of the row address latches 226, a column address isapplied to the address register 212. The address register 212 couplesthe column address to a column address latch 240. Depending on theoperating mode of the SDRAM 200, the column address is either coupledthrough a burst counter 242 to a column address buffer 244, or to theburst counter 242, which applies a sequence of column addresses to thecolumn address buffer 244 starting at the column address output by theaddress register 212. In either case, the column address buffer 244applies a column address to a column decoder 248.

Data to be read from one of the arrays 220, 222 is coupled to columncircuitry 250, 252 (i.e., sense amplifiers, I/O gating, DQM &WPB masklogic, block write col/byte mask logic) for one of the arrays 220, 222,respectively. The column circuitry 250, 252 may further include theN-latch driver circuit 253, which is coupled to at least one senseamplifier in the column circuitry 250, 252. Additionally, the isolationswitch driver circuit 255 may also be included as well. The data bitsdeveloped by the sense amplifiers are then coupled to a data outputregister 256. Data to be written to one of the arrays 220, 222 arecoupled from the data bus 258 through a data input register 260. Thewrite data are coupled to the column circuitry 250, 252 where they aretransferred to one of the arrays 220, 222, respectively. A mask register264 responds to a data mask DM signal to selectively alter the flow ofdata into and out of the column circuitry 250, 252, such as byselectively masking data to be read from the arrays 220, 222.

FIG. 9 shows an embodiment of a processor-based system 300 that may usethe SDRAM 200 or some other memory device that uses the sense amplifier100 or some other embodiment of the invention. The processor-basedsystem 300 includes a processor 302 for performing various computingfunctions, such as executing specific software to perform specificcalculations or tasks. The processor 302 includes a processor bus 304that normally includes an address bus, a control bus, and a data bus. Inaddition, the processor-based system 300 includes one or more inputdevices 314, such as a keyboard or a mouse, coupled to the processor 302to allow an operator to interface with the processor-based system 300.Typically, the processor-based system 300 also includes one or moreoutput devices 316 coupled to the processor 302, such output devicestypically being a printer or a video terminal. One or more data storagedevices 318 are also typically coupled to the processor 302 to storedata or retrieve data from external storage media (not shown). Examplesof typical storage devices 318 include hard and floppy disks, tapecassettes, and compact disk read-only memories (CD-ROMs). The processor302 is also typically coupled to a cache memory 326, which is usuallystatic random access memory (“SRAM”) and to the SDRAM 200 through amemory controller 330. The memory controller 330 includes an address bus214 to couple row addresses and column addresses to the DRAM 200. Thememory controller 330 also includes a control bus that couples commandsignals to a control bus 206 of the SDRAM 200. The external data bus 258of the SDRAM 200 is coupled to the data bus of the processor 302, eitherdirectly or through the memory controller 330.

From the foregoing it will be appreciated that, although specificembodiments of the invention have been described herein for purposes ofillustration, various modifications may be made without deviating fromthe spirit and scope of the invention. For example, embodiments of theinvention have been described with reference to an open digit lineconfiguration. However, embodiments of the present invention can beutilized in alternative digit line configurations, such as a foldeddigit line architecture. Accordingly, the invention is not limitedexcept as by the appended claims.

1. A sense amplifier circuit, comprising: a latch circuit coupled to adigit line and configured to latch a data state coupled to the digitline and further configured to generate differential data signals inresponse to the data state, the differential data signals having firstand second voltages; a first voltage supply circuit coupled to the latchcircuit and configured to provide a positive voltage as the firstvoltage; and a second voltage supply circuit coupled to the latchcircuit and configured to provide a negative voltage as the secondvoltage.
 2. The sense amplifier circuit of claim 1 wherein the latchcircuit comprises: first and second cross-coupled inverters.
 3. Thesense amplifier circuit of claim 1 wherein the latch circuit comprises:an NMOS latch coupled to the second voltage supply.
 4. The senseamplifier circuit of claim 1 wherein the second voltage supply circuitcomprises: a negative voltage supply configured to provide the negativevoltage; a ground reference; and a switching circuit coupled to thenegative voltage supply and the ground reference and configured tocouple the negative voltage supply to the latch during a first timeperiod and, during a second time period subsequent to the first timeperiod, decouple the latch from the negative voltage supply and couplethe ground reference to the latch.
 5. The sense amplifier circuit ofclaim 1 wherein the first voltage supply circuit includes a device powersupply.
 6. The sense amplifier circuit of claim 1 wherein the latchcircuit is further coupled to a complementary digit line, and the digitline and the complementary digit lines are associated with two differentmemory arrays.
 7. The sense amplifier circuit of claim 1, furthercomprising: a coupling circuit electrically coupled between the digitline and the latch circuit and configured to couple the digit line tothe latch circuit responsive a control signal; and a control circuitcoupled to the coupling circuit and configured to generate the controlsignal to couple the digit line to the latch circuit and decouple thedigit line and the latch circuit during a first phase and furtherconfigured to generate the control signal to couple the digit line tothe latch circuit during a second phase subsequent to the first phase,the digit line and the node coupled at a controlled rate during thesecond phase.
 8. The sense amplifier of claim 7 wherein the secondvoltage supply circuit comprises a supply circuit configured to providea negative voltage as the second voltage following the first phase andprior to the second phase, the supply circuit further configured toprovide a ground reference as the second voltage during the secondphase.
 9. The sense amplifier circuit of claim 1 wherein the firstvoltage supply circuit comprises a voltage supply configured to providea positive voltage greater than a device supply voltage.
 10. A senseamplifier circuit, comprising: a latch circuit having a node andconfigured to latch a data state coupled to the node and furtherconfigured to generate differential data signals in response to the datastate; a coupling circuit coupled to the node of the latch and to adigit line to which data states are coupled, the coupling circuitconfigured to couple the digit line to the node of the latch responsivea control signal; and a control circuit coupled to the coupling circuitand configured to control the coupling circuit to couple the digit lineto the node and decouple the digit line and the node during a firstphase and further configured to control the coupling circuit to couplethe digit line to the node during a second phase subsequent to the firstphase, the digit line and the node coupled at a controlled rate duringthe second phase.
 11. The sense amplifier circuit of claim 10 whereinthe control circuit comprises a control circuit configured to generate acontrol signal for the coupling circuit, the control circuit comprising:a first switch coupled to a first voltage supply and configured tocouple an output node at which the control signal is provided to thefirst voltage supply during the first phase and for a portion of thesecond phase; a second switch coupled to a second voltage supply andconfigured to couple the output node to the second voltage supply foranother portion of the second phase; and a third switch coupled toground and configured to couple the output node to ground between thefirst and second phases.
 12. The sense amplifier circuit of claim 10wherein the control circuit comprises a control circuit configured togenerate a control signal to control the coupling circuit, the controlsignal generated by the control circuit during the second phaseincreasing in voltage to an intermediate voltage at a first rate andfurther increasing in voltage to a second voltage at a second rate. 13.The sense amplifier circuit of claim 10 wherein the control circuitcomprises a control circuit configured to control the coupling circuitto couple the digit line to the node during the second phase over a timeperiod greater than the time period over which the digit line isdecoupled from the node during the first time period.
 14. The senseamplifier circuit of claim 10 wherein the latch circuit comprises: firstand second cross coupled inverters.
 15. The sense amplifier circuit ofclaim 10, further comprising: a first voltage supply circuit coupled tothe latch circuit and configured to provide a positive voltage as afirst voltage; and a second voltage supply circuit coupled to the latchcircuit and configured to provide a negative voltage as a secondvoltage.
 16. The sense amplifier circuit of claim 15 wherein the secondvoltage supply circuit comprises: a negative voltage supply configuredto provide the negative voltage; a ground reference; and a switchingcircuit coupled to the negative voltage supply and the ground referenceand configured to couple the negative voltage supply to the latchbetween the first and second phases and configured to couple the groundreference to the latch during the second phase.
 17. The sense amplifiercircuit of claim 15 wherein the latch circuit comprises: an NMOS latchcoupled to the second voltage supply.
 18. A sense amplifier circuit,comprising: a latch circuit coupled to a digit line and configured tolatch a data state coupled to the digit line and further configured togenerate differential data signals in response to the data state, thedifferential data signals having first and second voltages; a firstvoltage supply circuit coupled to the latch circuit and configured toprovide a voltage greater than a device supply voltage as the firstvoltage; and a second voltage supply circuit coupled to the latchcircuit and configured to provide the second voltage.
 19. The senseamplifier circuit of claim 18 wherein the latch circuit comprises: firstand second cross-coupled inverters.
 20. The sense amplifier circuit ofclaim 18 wherein the latch circuit comprises: a PMOS latch coupled tothe first voltage supply.
 21. The sense amplifier circuit of claim 18wherein the second voltage supply circuit comprises: a negative voltagesupply configured to provide the negative voltage; a ground reference;and a switching circuit coupled to the negative voltage supply and theground reference and configured to couple the negative voltage supply tothe latch during a first time period and, during a second time periodsubsequent to the first time period, decouple the latch from thenegative voltage supply and couple the ground reference to the latch.22. The sense amplifier circuit of claim 18 wherein the latch circuit isfurther coupled to a complementary digit line, and the digit line andthe complementary digit lines are associated with two different memoryarrays.
 23. The sense amplifier circuit of claim 18, further comprising:a coupling circuit electrically coupled between the digit line and thelatch circuit and configured to couple the digit line to the latchcircuit responsive a control signal; and a control circuit coupled tothe coupling circuit and configured to generate the control signal tocouple the digit line to the latch circuit and decouple the digit lineand the latch circuit during a first phase and further configured togenerate the control signal to couple the digit line to the latchcircuit during a second phase subsequent to the first phase, the digitline and the node coupled at a controlled rate during the second phase.24. The sense amplifier of claim 23 wherein the second voltage supplycircuit comprises a supply circuit configured to provide a negativevoltage as the second voltage following the first phase and prior to thesecond phase, the supply circuit further configured to provide a groundreference as the second voltage during the second phase.
 25. The senseamplifier circuit of claim 18 wherein the second voltage supply isconfigured to provide a negative voltage as the second voltage.
 26. Amemory device comprising: a row address circuit operable to receive anddecode row address signals applied to external address terminals of thememory device; a column address circuit operable to receive and decodecolumn address signals applied to the external address terminals; atleast one array of memory cells arranged in rows and columns, each ofthe memory cells having a location determined by the decoded row addresssignals and the decoded column address signals; a plurality of senseamplifiers coupled to respective columns of memory cells in the at leastone array, each of the sense amplifiers comprising a latch circuitcoupled to the respective column and configured to latch a data state ofa memory cell coupled to the digit line and further configured togenerate differential data signals in response to the data state, thedifferential data signals having first and second voltages; a firstvoltage supply circuit coupled to the latch circuit of at least onesense amplifier and configured to provide a positive voltage as thefirst voltage; a second voltage supply circuit coupled to the latchcircuit of at least one sense amplifier and configured to provide anegative voltage as the second voltage; a data path circuit operable tocouple data signals corresponding to the data states between the senseamplifiers and external data terminals of the memory device; and acommand decoder operable to decode a plurality of command signalsapplied to respective external command terminals of the memory device,the command decoder being operable to generate control signalscorresponding to the decoded command signals.
 27. The memory device ofclaim 26 wherein the second voltage supply circuit comprises: a negativevoltage supply configured to provide the negative voltage; a groundreference; and a switching circuit coupled to the negative voltagesupply and the ground reference and configured to couple the negativevoltage supply to the latch during a first time period and, during asecond time period subsequent to the first time period, decouple thelatch from the negative voltage supply and couple the ground referenceto the latch.
 28. The memory device of claim 26 wherein the senseamplifier further comprises a coupling circuit electrically coupledbetween a digit line of the respective column and the latch circuit andconfigured to couple the digit line to the latch circuit responsive acontrol signal, and the memory device further comprising a controlcircuit coupled to the coupling circuit of at least one sense amplifierand configured to generate the control signal to couple the respectivedigit line to the latch circuit and decouple the respective digit lineand the latch circuit during a first phase and further configured togenerate the control signal to couple the respective digit line to thelatch circuit during a second phase subsequent to the first phase, therespective digit line and the node coupled at a controlled rate duringthe second phase.
 29. The memory device of claim 28 wherein the secondvoltage supply circuit comprises a supply circuit configured to providea negative voltage as the second voltage following the first phase andprior to the second phase, the supply circuit further configured toprovide a ground reference as the second voltage during the secondphase.
 30. A memory device comprising: a row address circuit operable toreceive and decode row address signals applied to external addressterminals of the memory device; a column address circuit operable toreceive and decode column address signals applied to the externaladdress terminals; at least one array of memory cells arranged in rowsand columns, each of the memory cells having a location determined bythe decoded row address signals and the decoded column address signals,each column having at least one digit line; a plurality of senseamplifiers coupled to the digit line of the respective columns of memorycells in the at least one array, each of the sense amplifierscomprising: a latch circuit having a node and configured to latch a datastate from the respective digit line coupled to the node and furtherconfigured to generate differential data signals in response to the datastate; and a coupling circuit coupled to the node of the latch and tothe respective digit line, the coupling circuit configured to couple therespective digit line to the node of the latch responsive a controlsignal; a control circuit coupled to the coupling circuit of at leastone sense amplifier and configured to control the coupling circuit tocouple the respective digit line to the node and decouple the respectivedigit line and the node during a first phase and further configured tocontrol the coupling circuit to couple the respective digit line to thenode during a second phase subsequent to the first phase, the respectivedigit line and the node coupled at a controlled rate during the secondphase; a data path circuit operable to couple data signals correspondingto the data states between the sense amplifiers and external dataterminals of the memory device; and a command decoder operable to decodea plurality of command signals applied to respective external commandterminals of the memory device, the command decoder being operable togenerate control signals corresponding to the decoded command signals.31. The memory device of claim 30 wherein the control circuit comprisesa control circuit configured to generate a control signal for thecoupling circuit, the control circuit comprising: a first switch coupledto a first voltage supply and configured to couple an output node atwhich the control signal is provided to the first voltage supply duringthe first phase and for a portion of the second phase; a second switchcoupled to a second voltage supply and configured to couple the outputnode to the second voltage supply for another portion of the secondphase; and a third switch coupled to ground and configured to couple theoutput node to ground between the first and second phases.
 32. Thememory device of claim 30 wherein the control circuit comprises acontrol circuit configured to generate a control signal to control thecoupling circuit, the control signal generated by the control circuitduring the second phase increasing in voltage to an intermediate voltageat a first rate and further increasing in voltage to a second voltage ata second rate.
 33. The memory device of claim 30 wherein the controlcircuit comprises a control circuit configured to control the couplingcircuit to couple the digit line to the node during the second phaseover a time period greater than the time period over which the digitline is decoupled from the node during the first time period.
 34. Thememory device of claim 30, further comprising: a first voltage supplycircuit coupled to the latch circuit of at least one sense amplifier andconfigured to provide a positive voltage as a first voltage; and asecond voltage supply circuit coupled to the latch circuit of at leastone sense amplifier and configured to provide a negative voltage as asecond voltage.
 35. The memory device of claim 34 wherein the secondvoltage supply circuit comprises: a negative voltage supply configuredto provide the negative voltage; a ground reference; and a switchingcircuit coupled to the negative voltage supply and the ground referenceand configured to couple the negative voltage supply to the latchbetween the first and second phases and configured to couple the groundreference to the latch during the second phase.
 36. A processor-basedsystem, comprising: a processor having a processor bus; an input devicecoupled to the processor through the processor bus to allow data to beentered into the computer system; an output device coupled to theprocessor through the processor bus to allow data to be output from thecomputer system; a data storage device coupled to the processor throughthe processor bus to allow data to be read from a mass storage device; amemory controller coupled to the processor through the processor bus;and a memory device coupled to the memory controller, the memory devicecomprising: a row address circuit operable to receive and decode rowaddress signals applied to external address terminals of the memorydevice; a column address circuit operable to receive and decode columnaddress signals applied to the external address terminals; at least onearray of memory cells arranged in rows and columns, each of the memorycells having a location determined by the decoded row address signalsand the decoded column address signals; a plurality of sense amplifierscoupled to respective columns of memory cells in the at least one array,each of the sense amplifiers comprising a latch circuit coupled to therespective column and configured to latch a data state of a memory cellcoupled to the digit line and further configured to generatedifferential data signals in response to the data state, thedifferential data signals having first and second voltages; a firstvoltage supply circuit coupled to the latch circuit of at least onesense amplifier and configured to provide a positive voltage as thefirst voltage; a second voltage supply circuit coupled to the latchcircuit of at least one sense amplifier and configured to provide anegative voltage as the second voltage; a data path circuit operable tocouple data signals corresponding to the data states between the senseamplifiers and external data terminals of the memory device; and acommand decoder operable to decode a plurality of command signalsapplied to respective external command terminals of the memory device,the command decoder being operable to generate control signalscorresponding to the decoded command signals.
 37. The processor-basedsystem of claim 36 wherein the second voltage supply circuit comprises:a negative voltage supply configured to provide the negative voltage; aground reference; and a switching circuit coupled to the negativevoltage supply and the ground reference and configured to couple thenegative voltage supply to the latch during a first time period and,during a second time period subsequent to the first time period,decouple the latch from the negative voltage supply and couple theground reference to the latch.
 38. The processor-based system of claim36 wherein the sense amplifier further comprises a coupling circuitelectrically coupled between a digit line of the respective column andthe latch circuit and configured to couple the digit line to the latchcircuit responsive a control signal, and the memory device furthercomprising a control circuit coupled to the coupling circuit of at leastone sense amplifier and configured to generate the control signal tocouple the respective digit line to the latch circuit and decouple therespective digit line and the latch circuit during a first phase andfurther configured to generate the control signal to couple therespective digit line to the latch circuit during a second phasesubsequent to the first phase, the respective digit line and the nodecoupled at a controlled rate during the second phase.
 39. Theprocessor-based system of claim 38 wherein the second voltage supplycircuit comprises a supply circuit configured to provide a negativevoltage as the second voltage following the first phase and prior to thesecond phase, the supply circuit further configured to provide a groundreference as the second voltage during the second phase.
 40. Aprocessor-based system, comprising: a processor having a processor bus;an input device coupled to the processor through the processor bus toallow data to be entered into the computer system; an output devicecoupled to the processor through the processor bus to allow data to beoutput from the computer system; a data storage device coupled to theprocessor through the processor bus to allow data to be read from a massstorage device; a memory controller coupled to the processor through theprocessor bus; and a memory device coupled to the memory controller, thememory device comprising: a row address circuit operable to receive anddecode row address signals applied to external address terminals of thememory device; a column address circuit operable to receive and decodecolumn address signals applied to the external address terminals; atleast one array of memory cells arranged in rows and columns, each ofthe memory cells having a location determined by the decoded row addresssignals and the decoded column address signals, each column having atleast one digit line; a plurality of sense amplifiers coupled to thedigit line of the respective columns of memory cells in the at least onearray, each of the sense amplifiers comprising: a latch circuit having anode and configured to latch a data state from the respective digit linecoupled to the node and further configured to generate differential datasignals in response to the data state; and a coupling circuit coupled tothe node of the latch and to the respective digit line, the couplingcircuit configured to couple the respective digit line to the node ofthe latch responsive a control signal; a control circuit coupled to thecoupling circuit of at least one sense amplifier and configured tocontrol the coupling circuit to couple the respective digit line to thenode and decouple the respective digit line and the node during a firstphase and further configured to control the coupling circuit to couplethe respective digit line to the node during a second phase subsequentto the first phase, the respective digit line and the node coupled at acontrolled rate during the second phase; a data path circuit operable tocouple data signals corresponding to the data states between the senseamplifiers and external data terminals of the memory device; and acommand decoder operable to decode a plurality of command signalsapplied to respective external command terminals of the memory device,the command decoder being operable to generate control signalscorresponding to the decoded command signals.
 41. The processor-basedsystem of claim 40 wherein the control circuit comprises a controlcircuit configured to generate a control signal for the couplingcircuit, the control circuit comprising: a first switch coupled to afirst voltage supply and configured to couple an output node at whichthe control signal is provided to the first voltage supply during thefirst phase and for a portion of the second phase; a second switchcoupled to a second voltage supply and configured to couple the outputnode to the second voltage supply for another portion of the secondphase; and a third switch coupled to ground and configured to couple theoutput node to ground between the first and second phases.
 42. Theprocessor-based system of claim 40 wherein the control circuit comprisesa control circuit configured to generate a control signal to control thecoupling circuit, the control signal generated by the control circuitduring the second phase increasing in voltage to an intermediate voltageat a first rate and further increasing in voltage to a second voltage ata second rate.
 43. The processor-based system of claim 40 wherein thecontrol circuit comprises a control circuit configured to control thecoupling circuit to couple the digit line to the node during the secondphase over a time period greater than the time period over which thedigit line is decoupled from the node during the first time period. 44.The processor-based system of claim 40, further comprising: a firstvoltage supply circuit coupled to the latch circuit of at least onesense amplifier and configured to provide a positive voltage as a firstvoltage; and a second voltage supply circuit coupled to the latchcircuit of at least one sense amplifier and configured to provide anegative voltage as a second voltage.
 45. The processor-based system ofclaim 44 wherein the second voltage supply circuit comprises: a negativevoltage supply configured to provide the negative voltage; a groundreference; and a switching circuit coupled to the negative voltagesupply and the ground reference and configured to couple the negativevoltage supply to the latch between the first and second phases andconfigured to couple the ground reference to the latch during the secondphase.
 46. A method of sensing a data state coupled to a digit line,comprising: coupling the digit line to a sense node; providing anegative voltage; and latching the data state in response to thenegative voltage.
 47. The method of claim 46 wherein providing thenegative voltage comprises: providing the negative voltage for a firsttime period; and switching the negative voltage to a ground referencelevel following the first time period.
 48. The method of claim 47,further comprising: decoupling the digit line during at least the firsttime period; and recoupling the digit line following the first timeperiod.
 49. The method of claim 48 wherein recoupling the digit linecomprises: recoupling the digit line to the sense node at a controlledrate.
 50. The method of claim 49 wherein recoupling the digit line at acontrolled rate comprises: coupling the digit line to the sense node ata first rate; and coupling the digit line to the sense node at a secondrate following the first rate.
 51. The method of claim 50 whereincoupling the digit line to the sense node at the first rate comprises:coupling the digit line to the sense node at the first rate until anintermediate voltage.
 52. A method of coupling a digit line to a senseamplifier, comprising: coupling the digit line to the sense amplifierfor a first time period; decoupling the digit line from the senseamplifier for a second time period; and coupling the digit line to thesense amplifier at a controlled rate.
 53. The method of claim 52,further comprising sensing data coupled to the digit line and latchingthe data.
 54. The method of claim 53 wherein sensing of the data occursprior to decoupling the digit line and latching the data occurs prior tocoupling the digit line.
 55. The method of claim 53 wherein latching thedata comprises providing a negative voltage and latching the data inresponse to the negative voltage.
 56. The method of claim 55 whereinproviding the negative voltage comprises providing a negative voltageuntil the digit line is decoupled from the sense amplifier and providinga ground reference level thereafter.
 57. The method of claim 52 whereincoupling the digit line to the sense amplifier at a controlled ratecomprises coupling the digit line to the sense amplifier at a first rateand coupling the digit line to the sense amplifier at a second ratefollowing the first rate.